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OL1 Displacement Measurement Sensor

Brand: Sick AG

The OL1 optical micrometer stands out due to its miniature design and is small enough to fit in the tiniest machine spaces. 

Thanks to the LED alignment aid and a function for aligning the light band integrated into the AOD1 evaluation unit, installing and aligning the sender and receiver unit is child’s play. 

In particular, the OL1 sensor shows its strengths with the high-precision edge guiding function, for instance with the repeatable guidance of electrode material in battery production or the double layer detection of thin wafers. 

Due to the high performance reserve, the OL1 determines the edge position of semi-transparent materials exactly or reliably moves thin textile threads or wires back on the right track.
Features
  • The rugged miniature housing makes it possible to use it in very small installation spaces
  • Quick commissioning and easy machine integration via display configuration and LED-based alignment aid at the sensor heads
  • Quality optimization due to thickness measurement with micrometer precision
  • Reliable process control of web material thanks to exact edge position determination

1 - 1 of 1 Part Numbers
6065943
6065943
SICK Type: OL1S/OL1E-R1010A13
Communication interface: Serial 

Housing material: metal 

Laser class: 1 

Measuring range: 10 mm

Analog output: current output

Connection type: cable with M8 male connector, 4-pin, Y cable for connection to AOD1 evaluation unit

Typical light spot size (distance): 3 mm x 14 mm

Digital output: 3 x PNP/NPN, selectable

1 - 1 of 1 Part Numbers

Specifications

Brand

Certifications & Approvals

  • CE
  • cRUus

Measuring Range

  • 10 mm

Linearity

  • ± 40 µm

Repeatability

  • 10 µm

Response Time

  • ≥ 0.5 millisecond

Measuring Frequency

  • ≤ 2 kHz

Digital Output

  • 3 x PNP/NPN, Selectable

Light Source

  • Laser, Red

Type of Light

  • Visible Red Light

Analog Output

  • Current output

Operating Temperature

  • Ambient -10° to 50° C

Housing Material

  • Metal

  • Edge Control of Battery Electrodes
  • Diameter and Position Monitoring of Threads or Wires
  • Double Layer Detection When Handling Wafers
  • Guidance of Semi-transparent Films
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